The Expert Task Forces have been set up in order to deal with the highest expertises on the relevant sector, scope and terms of reference assigned by the CTL.

The added value of the ETFs is to handle with interpretation and uniform application of the IEC standards as well as to determine harmonized testing procedures on a continuous basis under the so called "two-months procedure".

The ETFs are coordinated by Conveners  and are under complete management of the CTL which decides on the approval of the provisional decisions issued by the ETFs.

G. Camiciotti (IMQ) Technical Advisor

G. Bukkjaer (UL International Demko A/S) Technical Advisor TOYS

J.D. Gonzales (IRAM)
K. Wilson (Wakefield Labs)
T. Lornitzo (TGM-VAE)
F. Rosenberger (OVE)
G. Tarseos (CSA International)
H. Wang (CQC)
Z. Jurda (EZU)
G. Bukkjaer (UL International Demko A/S)
O. Väyrynen (SGS FIMKO)
A. Barrere (LCIE)
B. Poesl (LGA Nürnberg)
M. Hingott (TÜV PS)
D. Fietz (TÜV PS)
P. Krakau(TÜV Rheinland Product Safety GmbH)
R. Gottschling (VDE)

Z. Zsákai (MEEI)
J. Sumiya (JET)
A. Sasaki (JQA)
Jong-Koo Park(KTL)
J.W. Koenhen (KEMA)
T. Ulsrud (NEMKO)
E. Cardoso (IEP)
J. Santos (CERTIF)
E.G. Chia (TUV SUD PSB)
M. Zontar (SIQ)
R. Guirado (LCOE)
L. Mattson (Intertek Semko AB)
R. Slupinski (UL Inc.)
J. Stimitz (UL Inc.)
L. Yap (Intertek Shanghai)
P. Seidel (TUV Rheinland HK)

T. Venalainen (CSA International) Technical Advisor
IEC 60065

M. Andersen (NEMKO) Technical Advisor
IEC 60065 & IEC 60950

T. Shiota (JQA) Technical Advisor
IEC 60065 & IEC 60950

T. Burke (UL Inc.) Technical Advisor 
IEC 60950

K. Wilson (Wakefield Labs)
J.D. Gonzales (IRAM)
T. Thun (TGM-VAE)
C. Diewald (TUV Austria)
X. Xiao (CQC)
F. Homolka (EZU)
J. J. Jensen (UL International Demko A/S)
T. Silonsaari (SGS FIMKO)
J. Lanzo (LCIE)
M. Hingott (TUV SUD PS)
H. Frerk (VDE)
A. Arndt (TÜV Rheinland Product Safety GmbH)
K.-H. Gompf (VDE)
I. Seres (MEEI)

F. Brivio (IMQ)
B. Burek (Intertek)
T. Kuboki (JET)
J. Ologbosere (TUV Rheinland Japan)
Jin-Soo Kim (KTL)
A. Bergervoet (KEMA)
M. Ng (TUV SUD PSB)
M. Kiselja (SIQ)
A. Orte (AENOR)
B. Jansson (Intertek Semko AB)
P. Cross (NEMKO)
D. Bras (EMITECH)
V.K. Truong (Electrosuisse)
P. Boden (UL Inc.)
C. Sato (UL Inc.)

H. Sattler (VDE) Technical Advisor

R. A. Wunderer (OFPZ)
A. Parzer (TÜV-A)
F. Homolka (EZU)
M. Mentula (SGS FIMKO)
J. Lanzo (LCIE)
O. A. Nielsen (UL International Demko A/S)
M. Sippl (TUV SUD PS, Convenor SC 62A/WG 14 - Liaison Officer)
D. Fietz (TUV SUD PS)
L. Freudenreich (TÜV Rheinland Product Safety GmbH)
V. Ebinghaus (TÜV Rheinland Product Safety GmbH)

R. Schoensteiner (LGA)
I. Seres (MEEI)
Mr. De Angiolini (IMQ)
F. Skarpsno (NEMKO)
M. Kiselja (SIQ)
C. Zhuo (TUV SUD PS)
P. Lymeus (Intertek Semko AB)
V.K. Truong (Electrosuisse)
G. Hines (ITS T&C)
J. Murnane (UL Inc.)
S. Poutissou (CSA International)
M. Brossoit (CSA International)
B. Burek (Intertek)

H. Bachl (CTI) Technical Advisor

B. Hedlund (Intertek Semko AB) Technical Advisor

B. B. Doyeo (IRAM)
G. Miscovich (IRAM)
C. Prochaska (TGM-VAE)
S. Piras (SGS CEBEC)
W. Zhang (CQC)
M. Sobeslavsky (EZU)
Lars. T. Hansen (UL International Demko A/S)
S. Lokfors (SGS FIMKO)
P. Balaire (Intertek Testing & Certification Ltd.)
G. Fabok (MEEI)
F. Brivio (IMQ)
M. Casari (IMQ)

K. Hasegawa (JET)
Sung-Hee Mo (KTL)
H. Barends (KEMA)
R. Hendriksen (KEMA)
J. Costa (ISQ)
J. Santos (CERTIF)
E. Venek (SIQ)
T. de Frutos (AENOR)
M. Huber (Electrosuisse)
C.S. Kurten (UL Inc.)
J.S. Antony (UL Inc.)

L. Noren (Intertek Semko AB) Technical Advisor

H. Müller (VDE) Technical Advisor

B. B. Doyeo (IRAM)
G. Miscovich (IRAM)
C. Prochaska (TGM-VAEE)
R. Stogmuller (OVE)
S. Chen (CQC)
F. Jandura (EZU)
G. Bukkjaer (UL International Demko A/S)
W. Parmiani (UL Demko/Sicur Control)
P. Fagerstedt (SGS FIMKO)
M. Lescure (LCIE)
D. Fietz (TUV SUD PS)
T. Haupt (TÜV Rheinland Product Safety GmbH)
H. Kilb (VDE)
W. Menger (VDE)
P. Uhlir (MEEI)
F. Rusnati (IMQ)
M. Kato (JET)

M. Stalder (Electrosuisse)
S. J. UK (KTL)
H. Telindert (KEMA)
T. Drost (KEMA)
J. Lopes (LIQ)
E. Venek (SIQ)
A. Valladolid (LCOE)
R. Webster (Intertek Testing & Certification Ltd.)
Mr. S. Poole (L.A.L.)
Ms. A. Branco  (CERTIF)
H.-K. Tan(TUV SUD PSB)
F. Tironi (FLOS - Expert from Industry)
A.D. Hughes (Thorn Lighting Ltd. - Expert from Industry)
T. Andersson (Intertek SEMKO AB)
C. Maes (SGS CEBEC)
G. Volberg (TÜV Rheinland Product Safety GmbH)

I. Mcguinnes (BSI) Technical Advisor

J. Tuma (EZU)
S. Lokfors (SGS FIMKO)
C. Mazzucchi (IMQ)
O.A. Nielsen (UL International Demko A/S)
G. Mackenbach (KEMA)
F. Shirai (JET)

Hoowo Kang (KTL)
A.C. Figueiral (CERTIF)
J.M. Cruz (ISQ)
H. Chuan Wee (TUV SUD PSB)
T. Kokelj (SIQ)
N. Tjapkin (VINCA)
 

S. Piras (SGS CEBEC)
M. Sobeslavsky (EZU)
Lars T. Hansen (UL International Demko A/S)
V. Friederichs (UL International Demko A/S)
J.-F. Bruel (LCIE)
S. Lautamies (SGS FIMKO)
W. Niedziella (VDE)

G. Fabok (MEEI)
M. Casari (IMQ)
S.P. Ahn (KERI)
H. Kormelink (KEMA)
A. Orte (AENOR)
B. Hedlund (Intertek Semko AB)

W. Herrmann (TUV RH)

A. Roth (VDE)

J. H. Wohlgemuth (BP SOLAREX)

N. Wilmot (Murdoch University)

F. Wouters (Ecofys)

S. Mizukami (JET)

H. Barikmo (TC82)

S. Wu (Intertek Taiwan)

T. Zgonena (UL inc.)

G. Tamizh-Mani (ARIZONA STATE UNIVERSITY EAST)

H. Yagi (Japan)

Dr. P. Varadi (PV Gap)

W. Kang (CQC)

P. Jourde (CEA)

C. Hee (Intertek Singapore)

B. Berglof (Intertek Semko)

D. Rivoltella (Sicur Control, UL International Demko A/S)

J. Zhen (CQC)

K.W. Friedrich (TÜV Rheinland Product Safety GmbH)

J. Nyman (Nemko)

S. Kloska (VDE)

A. Van der Meijden (KEMA)

H. Yamashita (JET)

S.-J. Kim (KTL)

T. Hada (JQA)

K. Webb (TUV SUD PS)

C. Cantaluppi (IMQ)

G. Gamperi (TGM-VAEE)

R. Guirado (LCOE)

B. Delisi (UL Inc)

C. Hauser (Electrosuisse)

M. Mak (SIQ)

J. Deng (TUV SUD PSB)

J. Merikari (SGS FIMKO)

D. BARBINI (CSA International)
M. LESCURE (LCIE)
M. HINGOTT (TUV SUD PS)
J. OLOGBOSERE (TUV RH JP)
M. ANDERSEN (NEMKO)
C. WEI (CQC)
S. SARACINO (IMQ)
B. JANSSON (Intertek Semko AB)
B. BREITENBACH (VDE)
J.O. STILLING (INTERTEK)
S. NONAKA (JAB)

M. Sato (Convenor ETF 1)
R. Wunderer (Convenor ETF 2)
T. Gaertner (Convenor ETF 3)
W. Niedziella (Convenor ETF 4)
E. Parma (Convenor ETF 5)
Ms. Zhu (Convenor ETF 6)
Mr. L. Ji (Convenor ETF 9)
JP. Barbier (Convenor ETF 10)
W. Strzelecki (Convenor ETF 11)
R. Vaickauski (Convenor WG1 & WG3)
K. Wilson (Wakefield Labs)
D. BARBINI (CSA International)
X. Mo (CQC)
Z. Egozi (SII)
J. Pierce (ITS USA)
I. Flemming (IFM)

Hubert BACHL (CTI)
Marc LESCURE (LCIE)
William FISKE (ITS-USA)
C.SWEE-GEE (TUV SUD PSB)
Arkadiusz SALWA (UL Inc.)

M. Sato (Convenor ETF1)
R. Wunderer (Convenor ETF2)
T. Gaertner (Convenor ETF3)
W. Niedziella (Convenor ETF4)
Ms. Zhu (Convenor ETF6)
R. Vaickauski (Convenor WG1 & WG3)
Mr. L. Ji (Convenor ETF 9)
H. Bachl (Convenor WG2 and convenor ETF 7 ad intertim)
J.P. Barbier (Convenor ETF 10)
W. Strzelecki (Convenor ETF 11)